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PIN ASSIGNMENTS

1

2

3

4

5

6

7

8

9

10

20

19

18

17

16

15

14

13

12

11

VINL

VINR

VREF1

VREF2

VCC

AGND

PDWN

BYPAS

TEST

LRCK

MODE1

MODE0

FMT1

FMT0

OSR

SCKI

VDD

DGND

DOUT

BCK

PCM1803

(TOP VIEW)

P0009-01

BLOCK DIAGRAM

BCK

VINL

Reference

VREF1

VREF2

VINR

Delta-Sigma

Modulator

Delta-Sigma

Modulator

×1/64 , ×1/128

Decimation

Filter

With

High-Pass Filter

Power Supply

AGND

VCC

VDD

DGND

Clock and Timing Control

Serial

Interface

Mode/

Format

Control

LRCK

DOUT

FMT0

FMT1

MODE0

MODE1

BYPAS

OSR

PDWN

SCKI

B0004-06

TEST

PCM1803

SLES125A – NOVEMBER 2004 – REVISED AUGUST 2006

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

ORDERING INFORMATION

PRODUCT

PACKAGE

PACKAGE

PACKAGE

ORDERING

TRANSPORT

QUANTITY

CODE

MARKING

NUMBER

MEDIA

PCM1803DB

Tube

65

PCM1803DB

20-Pin SSOP

DB

PCM1803

PCM1803DBR

Tape and Reel

2000

2

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