www.ti.com

Low-to-High-

Level Output

DUT

5.1 kΩ

1 µF

0.1 µF

1 kΩ

50 Ω

CL

(see Note A)

VDD

Pulse

Generator

Input Offset Voltage

Compensation Adjustment

10 Ω

10 Turn

1 V

- 1 V

Overdrive

Input

100 mV

Overdrive

Input

tf

tPHL

10%

50%

90%

90%

50%

tr

tPLH

High-to-Low-

Level Output

TEST CIRCUIT

VOLTAGE WAVEFORMS

10%

100 mV

NOTE: A.C includesprobeandjigcapacitance

L

TLC372-EP

LinCMOS™ DUAL DIFFERENTIAL COMPARATORS

SGLS385 – MARCH 2007

PARAMETER MEASUREMENT INFORMATION (continued)

Response time is defined as the interval between the application of an input step function and the instant when

the output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the

leading edge of the input pulse, while response time, high-to-low-level output, is measured from the trailing edge

of the input pulse. Response-time measurement at low input signal levels can be greatly affected by the input

offset voltage. The offset voltage should be balanced by the adjustment at the inverting input as shown in

Figure 3, so that the circuit is just at the transition point. Then a low signal, for example 105-mV or 5-mV

overdrive, causes the output to change state.

Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms

6

Submit Documentation Feedback