DAC8581

SLAS481C – AUGUST 2005 – REVISED OCTOBER 2012

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE/ORDERING INFORMATION(1)

PACKAGE

SPECIFICATION

PACKAGE

DRAWING

TEMPERATURE

ORDERING

ORDERING

TRANSPORT MEDIA,

PRODUCT

PACKAGE

NUMBER

RANGE

MARKING

NUMBER

QUANTITY

DAC8581IPW

Tube, 90-Piece

DAC8581

TSSOP-16

PW

–40°C to +85°C

D8581I

DAC8581IPWR

Tape and Reel, 2000-Piece

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

UNIT

AVDD or DVDD to AVSS

–0.3 V to 12 V

Digital input voltage to AVSS

–0.3 V to 12 V

VOUT or VREF to AVSS

–0.3 V to 12 V

DGND and AGND to AVSS

–0.3 V to 6 V

Operating temperature range

–40°C to +85°C

Storage temperature range

–65°C to +150°C

Junction temperature range (TJ max)

+150°C

Thermal impedance (

θJA)

118°C/W

Power dissipation

Thermal impedance (

θJC)

29°C/W

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

2

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Not Recommended For New Designs