LMV793, LMV794

SNOSAX6D – MARCH 2007 – REVISED MARCH 2013

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5V Electrical Characteristics

(1)

Unless otherwise specified, all limits are specified for TA = 25°C, V

+ = 5V, V− = 0V, V

CM = V

+/2 = V

O. Boldface limits apply at

the temperature extremes.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(2)

(3)

(2)

VOS

Input Offset Voltage

0.1

±1.35

mV

±1.65

TC VOS Input Offset Voltage Temperature Drift

(4)

LMV793

−1.0

μV/°C

LMV794

−1.8

IB

Input Bias Current

VCM = 2.0V

(5) (6)

−40°C ≤ TA ≤ 85°C

0.1

1

25

pA

−40°C ≤ TA ≤ 125°C

0.1

1

100

IOS

Input Offset Current

VCM = 2.0V

(6)

10

fA

CMRR

Common Mode Rejection Ratio

0V

≤ VCM ≤ 3.7V

80

100

dB

75

PSRR

Power Supply Rejection Ratio

2.0V

≤ V+ ≤ 5.5V, VCM = 0V

80

100

75

dB

1.8V

≤ V+ ≤ 5.5V, VCM = 0V

80

98

CMVR

Common Mode Voltage Range

CMRR

≥ 60 dB

−0.3

4

V

CMRR

≥ 55 dB

-0.3

4

AVOL

Open Loop Voltage Gain

VOUT = 0.3V to 4.7V, LMV793

85

97

RL = 2 kΩ to V

+/2

80

LMV794

82

89

dB

78

VOUT = 0.3V to 4.7V,

88

110

RL = 10 kΩ to V

+/2

84

VOUT

Output Voltage Swing High

RL = 2 kΩ to V

+/2

LMV793

35

75

82

LMV794

35

75

82

RL = 10 kΩ to V

+/2

25

65

71

mV from

either rail

Output Voltage Swing Low

RL = 2 kΩ to V

+/2

LMV793

42

75

78

LMV794

45

80

83

RL = 10 kΩ to V

+/2

20

65

67

IOUT

Output Current

Sourcing to V−

45

60

VIN = 200 mV

(7)

37

mA

Sinking to V+

10

21

VIN = –200 mV

(7)

6

IS

Supply Current per Amplifier

LMV793

1.15

1.40

1.75

mA

LMV794 per Channel

1.30

1.70

2.05

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under

conditions of internal self-heating where TJ > TA.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

Offset voltage average drift is determined by dividing the change in VOS by temperature change.

(5)

Positive current corresponds to current flowing into the device.

(6)

This parameter is specified by design and/or characterization and is not tested in production.

(7)

The short circuit test is a momentary test, the short circuit duration is 1.5 ms.

4

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