ABSOLUTE MAXIMUM RATINGS

DAC5686

SLWS147F – APRIL 2003 – REVISED JUNE 2009 ............................................................................................................................................................ www.ti.com

Terminal Functions (continued)

TERMINAL

I/O

DESCRIPTION

NAME

NO.

SDIO

30

I/O

Bidirectional serial-port data in the three-pin serial interface mode. Input-only serial data in the four-pin

serial interface mode. Internal pulldown

SDO

31

O

High-impedance state (the pin is not used) in the three-pin serial interface mode. Serial-port output data

in the four-pin serial interface mode.

SLEEP

96

I

Asynchronous hardware power-down input. Active high. Internal pulldown

TESTMODE

97

I

TESTMODE is DGND for the user.

TxENABLE

33

I

TxENABLE is used in interleaved mode. The rising edge of TxENABLE synchronizes the data of

channels A and B. The first data after the rising edge of TxENABLE is treated as A data, while the next

data is treated as B data and so on. In any mode, TxENABLE being low sets DAC outputs to midscale.

Internal pulldown

over operating free-air temperature range (unless otherwise noted)

(1)

UNIT

AVDD(2)

–0.5 V to 4 V

DVDD(3)

–0.5 V to 2.3 V

Supply voltage range

CLKVDD(2)

–0.5 V to 4 V

IOVDD(2)

–0.5 V to 4 V

PLLVDD(2)

–0.5 V to 4 V

Voltage between AGND, DGND, CLKGND, PLLGND, and IOGND

–0.5 V to 0.5 V

AVDD to DVDD

–0.5 V to 2.6 V

DA[15:0](3)

–0.5 V to IOVDD + 0.5 V

DB[15:0](3)

–0.5 V to IOVDD + 0.5 V

SLEEP(3)

–0.5 V to IOVDD + 0.5 V

CLK1, CLK2, CLK1C, CLK2C(3)

–0.5 V to CLKVDD + 0.5 V

Supply voltage range

RESETB(3)

–0.5 V to IOVDD + 0.5 V

LPF(3)

–0.5 V to PLLVDD + 0.5 V

IOUT1, IOUT2(2)

–1 V to AVDD + 0.5 V

EXTIO, BIASJ(2)

–0.5 V to AVDD + 0.5 V

EXTLO(2)

–0.5 V to IOVDD + 0.5 V

Peak input current (any input)

20 mA

Operating free-air temperature range, TA: DAC5686I

–40C to 85C

Storage temperature range

–65C to 150C

Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds

260C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Measured with respect to AGND

(3)

Measured with respect to DGND

6

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