CAT5251

Doc. No. MD-2017 Rev. F

6

© Catalyst Semiconductor, Inc.

Characteristics subject to change without notice

WRITE CYCLE LIMITS

Over recommended operating conditions unless otherwise stated.

Symbol

Parameter

Min

Typ

Max

Units

Write Cycle Time

5

ms

RELIABILITY CHARACTERISTICS

Over recommended operating conditions unless otherwise stated.

Symbol

Parameter

Reference Test Method

Min

Typ

Max

Units

(1)

Endurance

MIL-STD-883, Test Method 1033

1,000,000

Cycles/Byte

(1)

Data Retention

MIL-STD-883, Test Method 1008

100

Years

(1)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

(1)

Latch-Up

JEDEC Standard 17

100

mA

Figure 1. Sychronous Data Timing

Note: Dashed Line = mode (1, 1)

Figure 2. HOLD

¯¯¯¯¯ Timing

Notes:

(1) This parameter is tested initially and after a design or process change that affects the parameter.

VALID IN

IL

V

HI-Z

HI-Z

SCK

SI

SO

tFI

CS

CS

SCK

HOLD

SO

HIGH IMPEDANCE