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69F1608 Datasheet(PDF) 7 Page - Maxwell Technologies

Part # 69F1608
Description  128 Megabit (16M x 8-Bit) Flash Memory Module
PDF  33 Pages
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Manufacturer  MAXWELL [Maxwell Technologies]
Direct Link  http://www.maxwell.com
Logo MAXWELL - Maxwell Technologies

69F1608 Datasheet(HTML) 7 Page - Maxwell Technologies

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All data sheets are subject to change without notice
©2008 Maxwell Technologies
All rights reserved.
128 Megabit (16M x 8-Bit) Flash Memory Module
69F1608
03.07.08 REV 3
NAND FLASH TECHNICAL NOTES
Invalid Block(s)
Invalid blocks are defined as blocks that contain one or more invalid bits whose reliability is not guaranteed by the
manufacturer. Typically, an invalid block will contain a single bad bit. The information regarding the invalid block(s) is
called the invalid block information. The invalid block information is written to the 1st or the 2nd page of the invalid
block(s) with 00h data. Devices with invalid block(s) have the same quality level as devices with all valid blocks and
have the same AC and DC characteristics. An invalid block(s) does not affect the performance of valid block(s)
because it is isolated from the bit line and the common source line by a select transistor. The system design must be
able to mask out the invalid block(s) via address mapping. The 1st block of the NAND Flash, however, is fully guaran-
teed to be a valid block.
Identifying Invalid Block(s)
All device locations are erased (FFh) prior to shipping. Therefore, the system must be able to create the invalid block
table via the following suggested flow chart (Figure 1).
CE low to status output
t
CSTO
9, 10, 11
--
45
ns
RE high to WE low
t
RHW
9, 10, 11
0
--
ns
WE high to RE low
t
WHR
9, 10, 11
60
--
ns
RE access time (read ID)
t
READID
9, 10, 11
--
35
ns
Device resetting time (read/program/erase) after
erase suspend
t
RST
9, 10, 11
--
5/10/500
µ s
1. Not Tested
2. If CE goes high within 30 ns after the rising edge of the last RE, R/B will not return to V
OL.
3. The time to Ready depends on the value of the pull-up resistor tied to R/B pin.
4. To break the sequential read cycle, CE must be held high for longer than t
CEH.
TABLE 12. 69F1608 VALID BLOCKS 1,2
1. The device may include invalid blocks. Invalid blocks are defined as blocks that contain one or more bad bits. Do not try to
access these invalid blocks for program and erase. During its life time of 10 years and/or 1 million program/erase cycles, the
minimum number of valid blocks are guaranteed though its initial number could be reduced.
2. The 1st block, which is placed on the 00h block address, is guaranteed to be a valid block.
PARAMETER
SYMBOL
MIN
TYP
MAX
UNIT
Valid Block Number
N
VB
502
508
512
Blocks
TABLE 11. 69F1608 AC CHARACTERISTICS FOR OPERATION
(V
CC = 5 V ± 10%, TA = -40 TO +125
°C, UNLESS OTHERWISE NOTED)
PARAMETER
SYMBOL
SUBGROUPS
MIN
MAX
UNIT



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