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ADIS16365/PCBZ Datasheet(PDF) 15 Page - Analog Devices

Part # ADIS16365/PCBZ
Description  Tri-Axis Inertial Sensor
PDF  20 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
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ADIS16365/PCBZ Datasheet(HTML) 15 Page - Analog Devices

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Preliminary Technical Data
ADIS16365
Rev. PrA | Page 15 of 20
Data-Ready I/O Indicator
The MSC_CTRL register provides controls for a data-ready
function. For example, writing 0x05 to this register enables this
function and establishes DIO2 as an active-low, data-ready line.
The duty cycle is 25% (±10% tolerance).
Table 17. MSC_CTRL Bit Descriptions
Bits
Description
(Default = 0x0000)
[15:12]
Not used
[11]
Flash test
[10]
Internal self-test enable (clears on completion)
1 = enabled, 0 = disabled
[9]
Manual self-test, negative stimulus
1 = enabled, 0 = disabled
[8]
Manual self-test, positive stimulus
1 = enabled, 0 = disabled
[7]
Linear acceleration bias compensation for gyroscopes
1 = enabled, 0 = disabled
[6]
Linear accelerometer origin alignment
1 = enabled, 0 = disabled
[5:3]
Not used
[2]
Data-ready enable, 1 = enabled, 0 = disabled
[1]
Data-ready polarity, 1 = active high, 0 = active low
[0]
Data-ready line select, 1 = DIO2, 0 = DIO1
General Purpose I/O
The GPIO_CTRL register controls the direction and data of the
general-purpose digital lines, DIO1 through DIO4. For example,
writing a 0x02 to the GPIO_CTRL register sets DIO2 as an
output line and DIO1, DIO3, and DIO4 as input lines. Reading
the data bits in GPIO_CTRL reveals the logic level of each line.
Table 18. GPIO_CTRL Bit Descriptions
Bit
Description
(Default = 0x0000)
[15:12]
Not used
[11]
General-Purpose I/O Line 4 data level
[10]
General-Purpose I/O Line 3 data level
[9]
General-Purpose I/O Line 2 data level
[8]
General-Purpose I/O Line 1 data level
[7:4]
Not used
[3]
General-Purpose I/O Line 4, data direction control
1 = output, 0 = input
[2]
General-Purpose I/O Line 3, data direction control
1 = output, 0 = input
[1]
General-Purpose I/O Line 2, data direction control
1 = output, 0 = input
[0]
General-Purpose I/O Line 1, data direction control
1 = output, 0 = input
DIAGNOSTICS
Self-Test
Self-test exercises the mechanical structure of the sensor and
provides a simple method for verifying the operation of the
entire sensor signal conditioning circuit. There are two different
self-test options: startup and manual. If either of these self-tests
results in a failure, the self-test error flag, located in the STATUS
register, sets to 1. The manual self-test option results in a
repeating pattern, until the bit is set back to 0. While in the
manual self-test loop, SMPL_PRD and AVG_CNT cannot be
changed. See Table 17 for the appropriate MSC_CTRL bit
designations.
Alarm Registers
The alarm function provides monitoring for two independent
conditions. The ALM_CTRL register provides control inputs
for data source, data filtering (prior to comparison), static/
dynamic, and output indicator configurations. The ALM_MAGx
registers establish the trigger threshold and polarity configura-
tions. The ALM_SMPLx registers provide the numbers of
samples to use in the dynamic, rate-of-change configuration.
The rate-of-change calculation is
?
or
is
)
(
)
1
(
1
C
C
DS
N
n
DS
C
M
Y
Alarm
n
y
n
y
N
Y
<
>
⇒
⇒
−
+
=
∑
=1
where:
NDS is the number of samples in ALM_SMPLx.
y(n) is the sampled output data.
MC is the magnitude for comparison in ALM_MAGx.
> or < is determined by the MSB in ALM_MAGx.
Table 19. ALM_MAG1/ALM_MAG2 Bit Designations
Bit
Description
(Default = 0x0000)
[15]
Comparison polarity: 1 = greater than, 0 = less than
[14]
Not used
[13:0]
Data bits, matches format of trigger source selection
Table 20. ALM_SMPL1/ALM_SMPL2 Bit Designations
Bit
Description
(Default = 0x0001)
[15:8]
Not used
[7:0]
Data bits: number of samples (both 0x00 and 0x01 = 1)



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