STM8AP5X27TAY datasheet(87/100 Pages) STMICROELECTRONICS

87 / 100 page

STM8AF61xx, STM8AF51xx

Electrical characteristics

87/100

Static latch-up

Two complementary static tests are required on 10 parts to assess the latch-up

performance.

●

A supply overvoltage (applied to each power supply pin) and

●

A current injection (applied to each input, output and configurable I/O pin) are

performed on each sample.

This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the

application note AN1181.

Table 40.

ESD absolute maximum ratings

Symbol

Ratings

Conditions

Class

Maximum

value(1)

Data based on characterization results, not tested in production

Unit

VESD(HBM)

Electrostatic discharge voltage

(Human body model)

TA = 25°C, conforming to

JESD22-A114

4000

VESD(CDM)

Electrostatic discharge voltage

(Charge device model)

TA= 25°C, conforming to

JESD22-C101

500

VESD(MM)

Electrostatic discharge voltage

(Machine model)

TA= 25°C, conforming to

JESD22-A115

200

Table 41.

Electrical sensitivities

Symbol

Parameter

Conditions

Class(1)

Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the

JEDEC specifications, that means when a device belongs to class A it exceeds the JEDEC standard. B

class strictly covers all the JEDEC criteria (international standard).

Static latch-up class

TA = 25 °C

TA = 85 °C

TA = 125 °C

TA = 145 °C

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