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HAT2016R Datasheet(PDF) 4 Page - Renesas Technology Corp |
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HAT2016R Datasheet(HTML) 4 Page - Renesas Technology Corp |
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4 / 8 page ![]() HAT2016R Rev.10.00 Sep 07, 2005 page 4 of 7 Case Temperature Tc (°C) Static Drain to Source on State Resistance vs. Temperature Drain Current ID (A) Forward Transfer Admittance vs. Drain Current 0.10 0.08 0.02 0.04 0.06 –40 0 40 80 120 160 0 ID = 1 A, 2 A, 5 A 1 A, 2 A, 5 A 10 V VGS = 4 V 0.2 0.5 1 2 5 10 20 20 10 2 5 1 0.2 0.5 25°C Tc = –25°C 75°C Pulse Test VDS = 10 V Pulse Test Reverse Drain Current IDR (A) Body-Drain Diode Reverse Recovery Time Drain to Source Voltage VDS (V) Typical Capacitance vs. Drain to Source Voltage Gate Charge Qg (nc) Dynamic Input Characteristics 0.2 0.5 1 2 5 10 20 500 200 100 20 50 10 5 di / dt = 20 A / µs VGS = 0, Ta = 25°C 010 20 30 40 50 10000 3000 1000 300 100 30 10 Ciss Coss Crss VGS = 0 f = 1 MHz 50 0 10 20 30 40 0 20 8 1624 3240 0 4 8 12 16 VGS VDS VDD = 5 V 10 V 25 V VDD = 25 V 10 V 5 V ID = 6.5 A Source to Drain Voltage VSD (V) Reverse Drain Current vs. Source to Drain Voltage 20 0 4 8 12 16 0 0.4 0.8 1.2 1.6 2.0 VGS = 0, –5 V 5 V Pulse Test |
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