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SN65220DBVT Datasheet(PDF) 2 Page - Texas Instruments

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Part # SN65220DBVT
Description  USB PORT TRANSIENT SUPPRESSORS
PDF  9 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SN65220DBVT Datasheet(HTML) 2 Page - Texas Instruments

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SN65220
SN65240
SN75240
SLLS266F − FEBRUARY 1997 − REVISED JULY 2004
www.ti.com
2
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate
precautions. Failure to observe proper handling and installation procedures can cause damage.
IEC1000-4-2 COMPLIANCE LEVEL
IEC1000-4-2
MAXIMUM TEST VOLTAGE
IEC1000-4-2
COMPLIANCE
LEVEL
CONTACT
DISCHARGE
(kV)
AIR
DISCHARGE
(kV)
1
2
2
2
4
4
3
6
8
4
8
15
PACKAGE/ORDERING INFORMATION
PRODUCT
SUPRESSORS
TA
PACKAGE
PACKAGE
DESIGNATOR
MARKED
AS
ORDER NUMBER
WCSP−4
YZB
NWP or
SN65220YZBR (Reel)
SN65220
1
−40
°C to 85°C
WCSP−4
YZB
NWP or
65220
SN65220YZBT (Mini Reel)
SN65220
1
−40
°C to 85°C
SOT23−6
DBV
SADI
SN65220DBVR (Mini Reel)
SOT23−6
DBV
SADI
SN65220DBVT (Mini Reel)
DIP−8
P
SN65240P (Rail)
SN65240
2
−40
°C to 85°C
TSSOP−8
PW
A65240
SN65240PW (Rail)
SN65240
2
−40 C to 85 C
TSSOP−8
PW
A65240
SN65240PWR (Reel)
DIP−8
P
SN75240P (Rail)
SN75240
2
0
°C to 70°C
TSSOP−8
PW
A75240
SN75240PW (Rail)
SN75240
2
0 C to 70 C
TSSOP−8
PW
A75240
SN75240PWR (Reel)
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
UNIT
Continuous power dissipation
See Dissipation Rating Table
Electrostatic discharge
15 kV(2), 2 kV(3)
Peak power dissipation, PD(peak)
60 W
Peak forward surge current, IFSM
3 A
Peak reverse surge current, IRSM
−9 A
Storage temperature range, Tstg
−65
°C to 150°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade
device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is
not implied.
(2) Human Body Model − Tested in accordance with JEDEC Standard 22, Test Method A114−A.
(3) Charged Device Model − Tested in accordance with JEDEC Standard 22, Test Method C101.



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