17

A.C. CONDITIONS OF TEST

Input Pulse Levels

0V to 3V

Input Rise and Fall Times

10ns

Input and Output Timing Levels

1.5V

2899 PGM T09.1

EQUIVALENT A.C. TEST CIRCUIT

Note: (5)

This parameter is periodically sampled and not 100% tested.

E Controlled Read Cycle

E Controlled Read Cycle

No.

Symbol

Parameter

Min.

Max.

Units

Address Strobe Pulse Width

80

ns

Address Setup Time

20

ns

Address Hold Time

30

ns

Data Access Time

120

ns

Data Hold Time

0

ns

CE Setup Time

7

ns

E Pulse Width

150

ns

Enable Setup Time

30

ns

E Hold Time

20

ns

10

R/

W Setup Time

20

ns

11

E LOW to High Z Output

50

ns

2899 PGM T10.1

A.C. CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)

AS

A/D0–A/D7

A8–A12

R/W

AIN

DOUT

2899 ILL F21

CE

A8–A12

E

1

6

8

3

4

10

7

9

11

5

9

2

2899 ILL F20.2

5V

1.92K

Ω

100pF

OUTPUT

1.37K

Ω