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HAL2830 Datasheet(PDF) 2 Page - Micronas |
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HAL2830 Datasheet(HTML) 2 Page - Micronas |
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2 / 2 page ![]() PRODUCT INFORMATION HAL 2830 May/2008 All information and data contained in this product information are without any commitment, are not to be consid- ered as an offer for conclusion of a contract, nor shall they be construed as to create any liability. Product or development sample availability and delivery are exclusively subject to our respective order confirmation form. By this publication, Micronas GmbH does not assume responsibility for patent infringements or other rights of third parties which may result from its use. Micronas GmbH ⋅ Hans-Bunte-Strasse 19 ⋅ D-79108 Freiburg (Germany) ⋅ P.O. Box 840 ⋅ D-79008 Freiburg (Germany) Tel. +49-761-517-0 ⋅ Fax +49-761-517-2174 ⋅ E-mail: docservice@micronas.com ⋅ www.micronas.com No part of this publication may be reproduced, photo- copied, stored on a retrieval system, or transmitted without the express written consent of Micronas GmbH. Edition May 2, 2008; Order No. PI000124_001EN Development Tools For engineering and production purposes, Micronas offers an easy-to-use application kit: V Micronas programmer board (HAL-APB V 1.3) V LabVIEWTM programming software for Windows® 9x/ 2000/ XP/Vista V LabVIEW VIs Serial Port HAL Programmer Board Fig. 1: Development tool setup System Architecture The HAL 2830 sensors are produced in a proven automotive submicron CMOS tech- nology. The HAL 2830 features a temperature-com- pensated Hall plate with spinning-current offset compensation, an A/D converter for the Hall-plate, an A/D converter for the tem- perature sensor, digital signal processing (RISC processor), a digital SENT interface, an EEPROM memory with redundancy and lock function for the calibration data and the SENT output configuration, and protection devices on all pins. The HAL 2830 is programmable by means of BiPhase-M telegrams. No additional pro- gramming pin is needed. The sensor is pro- grammed through its output pin. Open-Drain output with slew rate control Internally Temperature Oscillator Switched A/D Digital DIO VSUP GND EEPROM Memory Lock Control stabilized Supply and Protection Devices Dependent Bias Protection Devices Hall Plate Converter Signal Processing Temperature A/D Sensor Converter SENT Molule Fig. 2: Block diagram of the HAL 2830 |
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