ABSOLUTE MAXIMUM RATINGS

(1)

REF5020-Q1, REF5025-Q1, REF5030-Q1

REF5040-Q1, REF5045-Q1, REF5050-Q1

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

OUTPUT VOLTAGE

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

STANDARD GRADE (8 ppm, 0.1%)

REF5020A

2.048 V

SO-8

D

RFQ5020

REF5025A

2.5 V

SO-8

D

RFQ5025

REF5030A

3.0 V

SO-8

D

PREVIEW

REF5040A

4.096 V

SO-8

D

PREVIEW

REF5045A

4.5 V

SO-8

D

RFQ5045

REF5050A

5.0 V

SO-8

D

PREVIEW

HIGH GRADE (3 ppm, 0.05%)

REF5020I

2.048 V

SO-8

D

RFQ5020

REF5025I

2.5 V

SO-8

D

PREVIEW

REF5030I

3.0 V

SO-8

D

PREVIEW

REF5040I

4.096 V

SO-8

D

PREVIEW

REF5045I

4.5 V

SO-8

D

PREVIEW

REF5050I

5.0 V

SO-8

D

PREVIEW

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

PARAMETER

REF50xx

UNIT

Input Voltage

+18

V

Output Short-Circuit

30

mA

Operating Temperature Range

–55 to +125

°C

Storage Temperature Range

–65 to +150

°C

+150

°C

Human Body Model (HBM)

3000

V

ESD Rating

Charged Device Model (CDM)

1000

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

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