N08L63W2AB7IT datasheet(5/10 Pages) ONSEMI

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N08L63W2A

Timing Test Conditions

Item

Input Pulse Level

0.1VCC to 0.9 VCC

Input Rise and Fall Time

5ns

Input and Output Timing Reference Levels

0.5 VCC

Output Load

CL = 30pF

Operating Temperature

-40 to +85 oC

Timing

Item

Symbol

2.3 - 3.6 V

2.7 - 3.6 V

Units

Min.

Max.

Min.

Max.

Read Cycle Time

tRC

Address Access Time (Random Access)

tAA

Address Access Time (Page Mode)

tAAP

Chip Enable to Valid Output

tCO

Output Enable to Valid Output

tOE

Byte Select to Valid Output

tLB, tUB

Chip Enable to Low-Z output

tLZ

Output Enable to Low-Z Output

tOLZ

Byte Select to Low-Z Output

tLBZ, tUBZ

Chip Disable to High-Z Output

tHZ

0200

Output Disable to High-Z Output

tOHZ

0200

Byte Select Disable to High-Z Output

tLBHZ, tUBHZ

0200

Output Hold from Address Change

tOH

Write Cycle Time

tWC

Chip Enable to End of Write

tCW

Address Valid to End of Write

tAW

Byte Select to End of Write

tLBW, tUBW

Write Pulse Width

tWP

Address Setup Time

tAS

Write Recovery Time

tWR

Write to High-Z Output

tWHZ

Data to Write Time Overlap

tDW

Data Hold from Write Time

tDH

End Write to Low-Z Output

tOW

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