S5F429PX02-LAB0 datasheet(10/18 Pages) SAMSUNG

10 / 18 page

S5F429PX02

1/4 INCH CCD IMAGE SENSOR FOR CCIR CAMERA

TEST METHODS

1. Measure the light intensities (L) when the averaged illuminance output value (Y) is the standard illuminance

output value, 150mV (YA) and when half of 150mV (1/2 YA).

2. Adjust the light intensity to 15 times of the value with which Y is YA, then measure the averaged illuminance

output value (Y = YSAT).

3. Adjust the light intensity to 500 times of the value with which Y is YA, then remove the read-out clock and drain

the signal in photosensors by the electronic shutter operation in all the respective horizontal blanking times with

the other clocks unchanged. Measure the maximum illuminance output value (YSM).

4. Adjust the light intensity to 1,000 times of the value with which Y is YA, then inspect whether there is blooming

phenomenon or not.

5. Measure the maximum and minimum illuminance output value (YMAX, YMIN) when the light intensity is adjusted

to make Y to be YA.

6. Measure YD with the horizontal idling time transfer level as reference, when the device ambient temperature is

°C and all of the light sources are shielded.

7. Follow test method 6, measure the maximum (DMAX) and minimum illuminance output (DMIN).

---YA

–

---YA

–

-----------------------------

-----------

500

----------

-------

100 %

( )

MAX

MIN

–

------------------------------------

100 %

( )

∆D

MAX

MIN

–

S5F429PX02-LAB0 Datasheet(PDF) 10 Page - Samsung semiconductor