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74LVC2G66GD Datasheet(PDF) 12 Page - NXP Semiconductors |
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74LVC2G66GD Datasheet(HTML) 12 Page - NXP Semiconductors |
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12 / 26 page ![]() 74LVC2G66 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 5 — 16 June 2010 12 of 26 NXP Semiconductors 74LVC2G66 Bilateral switch Test data is given in Table 11. Definitions for test circuit: RL = Load resistor. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = Test voltage for switching times. Fig 19. Test circuit for measuring switching times VEXT VCC VI VO 001aae235 DUT CL RT RL RL PULSE GENERATOR VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf Table 11. Test data Supply voltage Input Load VEXT VCC VI tr, tf CL RL tPLH, tPHL tPZH, tPHZ tPZL, tPLZ 1.65 V to 1.95 V VCC ≤ 2.0ns 30pF 1 k Ω open GND 2 × V CC 2.3 V to 2.7 V VCC ≤ 2.0ns 30pF 500 Ω open GND 2 × V CC 2.7 V 2.7 V ≤ 2.5ns 50pF 500 Ω open GND 6 V 3.0 V to 3.6 V 2.7 V ≤ 2.5ns 50pF 500 Ω open GND 6 V 4.5 V to 5.5 V VCC ≤ 2.5ns 50pF 500 Ω open GND 2 × V CC |
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