CLP200M_03 datasheet(14/21 Pages) STMICROELECTRONICS

14 / 21 page

Obsolete

Product(s)

- Obsolete

Product(s)

CLP200M

14/21

TEST CIRCUIT FOR ISWOFF PARAMETER : GO-NO GO TEST

-VP

BAT

-48V

Surge

generator

D.U.T.

This is a GO-NO GO test which allows to confirm the switch-off (ISWOFF) level in a functional test circuit.

TEST PROCEDURE :

- Adjust the current level at the ISWOFF value by short circuiting the D.U.T.

- Fire the D.U.T. with a surge current : IPP = 10A, 10/1000

µs.

- The D.U.T. will come back to the OFF-state within a duration of 50ms max.

100

200

300

500

Rsense ( )

Ω

ISWON (mA)

-20°C

25°C

75°C

Fig. 29 : Typical variation of switching-on current

(positive or negative) versus RSENSE resistor and

junction temperature (see test condition Fig 31).

100

200

300

500

Rsense ( )

Ω

Iswon @ 25°C (mA)

Iswon min

Iswon max

Iswon min

negative

positive

Fig. 30 : Variation of switching-on current versus

RSENSE at 25°C.

TIPL

TIPS

GND

Rsense

RINGL RINGS

DUT

48 V

Fig. 31 : ISWON MEASUREMENT

- Iswon = I1 when the CLP200M switches on (I1 is

progressively increased using R)

- Both TIP and RING sides of the CLP200M are

checked

-RL =10

Ω.

-40

-20

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

Tj (°C)

ISWOFF [Tj°C] / ISWOFF [25°C]

Fig. 32 : Relative variation of switching-off current

versus junction temperature for RSENSE between 3

and 10

Ω.

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