Electrical characteristics

STx20NK50Z

6/18

Doc ID 9118 Rev 9

The built-in back-to-back Zener diodes have specifically been designed to enhance not only

the device’s ESD capability, but also to make them safely absorb possible voltage transients

that may occasionally be applied from gate to source. In this respect the Zener voltage is

appropriate to achieve an efficient and cost-effective intervention to protect the device’s

integrity. These integrated Zener diodes thus avoid the usage of external components.

Table 7.

Source drain diode

Symbol

Parameter

Test conditions

Min.

Typ.

Max.

Unit

(1)

1.

Pulsed: pulse duration=300µs, duty cycle 1.5%

Source-drain current

Source-drain current (pulsed)

-

17

68

A

A

(2)

2.

Pulse width limited by safe operating area

Forward on voltage

-

1.6

V

Reverse recovery time

Reverse recovery charge

Reverse recovery current

di/dt = 100 A/µs

(see

Figure 21)

-

355

3.90

22

ns

µC

A

Reverse recovery time

Reverse recovery charge

Reverse recovery current

di/dt = 100 A/µs

(see

Figure 21)

-

440

5.72

26

ns

µC

A

Table 8.

Gate-source Zener diode

Symbol

Parameter

Test conditions

Min.

Typ.

Max.

Unit

Gate-source breakdown voltage

Igs=± 1mA (open drain)

30

V