DMD1012

DMD1012-A

Document Number 7346

Issue 1

Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed

to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.

Semelab encourages customers to verify that datasheets are current before placing orders.

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

70

3

1

17

2.4

0.1

13

50

20:1

180

90

7.5

f = 500MHz

f = 1MHz

f = 1MHz

V

mA

μA

V

mhos

V

dB

%

—

pF

pF

pF

Drain–Source Breakdown

Voltage

Zero Gate Voltage

Drain Current

Gate Leakage Current

Gate Threshold Voltage*

Forward Transconductance*

Gate Threshold Voltage

Matching Between Sides

Common Source Power Gain

Drain Efficiency

Load Mismatch Tolerance

Input Capacitance

Output Capacitance

Reverse Transfer Capacitance

Thermal Resistance Junction – Case

Max. 0.35°C / W

0.6 °C / W -A Version

THERMAL DATA

* Pulse Test:

Pulse Duration = 300

μs , Duty Cycle ≤ 2%

TOTAL DEVICE

PER SIDE

PER SIDE

η

VSWR