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ZXGD3004E6 Datasheet(PDF) 4 Page - Diodes Incorporated |
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ZXGD3004E6 Datasheet(HTML) 4 Page - Diodes Incorporated |
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4 / 8 page ![]() ZXGD3004E6 Issue 1 - October 2007 4 www.zetex.com © Zetex Semiconductors plc 2007 Electrical characteristics (at Tamb = 25°C unless otherwise stated). Switching time test circuits Timing diagram Parameter Symbol Min. Typ. Max. Unit Conditions Output voltage, high VOH VIN1 – 0.4 V Isource = 1 A Output voltage, low VOL VIN1 + 0.4 V Isink = 1 A Source output leakage current IL(source) 1 AVCC = 40V, VIN1 = VIN2 = 0V Sink output leakage current IL(sink) 1 AVCC = 40V, VIN1 = VIN2 = VCC Quiescent current IQ 50 nA VCC = 32V, VIN1 = VIN2 = 0V Source output current I(source) 1.2 1.9 A IIN1+IIN2 = 10mA Sink output current I(sink) 1.2 1.9 A IIN1+IIN2 = 10mA Source output current I(source)PK 8A IIN1+IIN2 = 1A Sink output current I(sink)PK 8A IIN1+IIN2 = 1A Gate driver switching times td(rise) tr td(fall) tf 1.1 13.4 0.95 12.4 ns ns ns ns CL=1.5nF, RL=0.1 , VCC=15V, VIN=12.5V, RS=25 Gate driver switching times td(rise) tr td(fall) tf 3.2 77.9 3.6 82 ns ns ns ns CL=1.5nF, RL=0.1 , VCC=15V, VIN=12.5V, RS=1k |
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