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CBTL06DP211EE Datasheet(PDF) 8 Page - NXP Semiconductors |
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CBTL06DP211EE Datasheet(HTML) 8 Page - NXP Semiconductors |
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8 / 18 page ![]() CBTL06DP211 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 1 — 21 February 2011 8 of 18 NXP Semiconductors CBTL06DP211 DisplayPort Gen1 2 : 1 multiplexer 8. Limiting values [1] Human Body Model: ANSI/EOS/ESD-S5.1-1994, standard for ESD sensitivity testing, Human Body Model - Component level; Electrostatic Discharge Association, Rome, NY, USA. [2] Charged-Device Model: ANSI/EOS/ESD-S5.3-1-1999, standard for ESD sensitivity testing, Charged-Device Model - Component level; Electrostatic Discharge Association, Rome, NY, USA. 9. Recommended operating conditions [1] HPD input is tolerant to 5 V input, provided a 1 k Ω series resistor between the voltage source and the pin is placed in series. See Section 11.1 “Special considerations”. [2] DDC/AUX inputs are tolerant to 5 V input, provided a 2.2 k Ω series resistor between the voltage source and the pin is placed in series. See Section 11.1 “Special considerations”. Table 7. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDD supply voltage −0.3 +5 V Tcase case temperature −40 +85 °C VESD electrostatic discharge voltage HBM [1] - 8000 V HBM; CMOS inputs [1] - 2000 V CDM [2] - 1000 V CDM; CMOS inputs [2] 500 V Table 8. Recommended operating conditions Symbol Parameter Conditions Min Typ Max Unit VDD supply voltage 3.0 3.3 3.6 V VI input voltage CMOS inputs −0.3 - VDD +0.3 V HPD, DDC/AUX inputs [1][2] −0.3 - VDD +0.3 V other inputs −0.3 - +2.6 V Tamb ambient temperature operating in free air −40 - +85 °C |
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