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DSPIC30F2010 Datasheet(PDF) 117 Page - Microchip Technology |
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DSPIC30F2010 Datasheet(HTML) 117 Page - Microchip Technology |
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117 / 202 page ![]() © 2011 Microchip Technology Inc. DS70118J-page 117 dsPIC30F2010 18.7.3.3 600 ksps Configuration Items The following configuration items are required to achieve a 600 ksps conversion rate. • Comply with conditions provided in Table 18-2 • Connect external VREF+ and VREF- pins following the recommended circuit shown in Figure 18-2 • Set SSRC<2:0> = 111 in the ADCON1 register to enable the auto-convert option • Enable automatic sampling by setting the ASAM control bit in the ADCON1 register • Enable sequential sampling by clearing the SIMSAM bit in the ADCON1 register • Enable at least two sample and hold channels by writing the CHPS<1:0> control bits in the ADCON2 register • Write the SMPI<3:0> control bits in the ADCON2 register for the desired number of conversions between interrupts. At a minimum, set SMPI<3:0> = 0001 since at least two sample and hold channels should be enabled • Configure the A/D clock period to be: by writing to the ADCS<5:0> control bits in the ADCON3 register • Configure the sampling time to be 2 TAD by writing: SAMC<4:0> = 00010 Select at least two channels per analog input pin by writing to the ADCHS register. 18.8 A/D Acquisition Requirements The analog input model of the 10-bit ADC is shown in Figure 18-3. The total sampling time for the A/D is a function of the internal amplifier settling time, device VDD and the holding capacitor charge time. For the A/D converter to meet its specified accuracy, the charge holding capacitor (CHOLD) must be allowed to fully charge to the voltage level on the analog input pin. The source impedance (RS), the interconnect impedance (RIC), and the internal sampling switch (RSS) impedance combine to directly affect the time required to charge the capacitor CHOLD. The combined impedance of the analog sources must therefore be small enough to fully charge the holding capacitor within the chosen sample time. To minimize the effects of pin leakage currents on the accuracy of the A/D converter, the maximum recommended source impedance, RS, is 5 k Ω. After the analog input channel is selected (changed), this sampling function must be completed prior to starting the conversion. The internal holding capacitor will be in a discharged state prior to each sample operation. The user must allow at least 1 TAD period of sampling time, TSAMP, between conversions to allow each sam- ple to be acquired. This sample time may be controlled manually in software by setting/clearing the SAMP bit, or it may be automatically controlled by the A/D con- verter. In an automatic configuration, the user must allow enough time between conversion triggers so that the minimum sample time can be satisfied. Refer to the Electrical Specifications for TAD and sample time requirements. FIGURE 18-3: ADC ANALOG INPUT MODEL 1 12 x 600,000 = 138.89 ns CPIN VA Rs ANx VT = 0.6V VT = 0.6V I leakage RIC ≤250Ω Sampling Switch RSS CHOLD = DAC capacitance VSS VDD = 4.4 pF ± 500 nA Legend: CPIN VT I leakage RIC RSS CHOLD = input capacitance = threshold voltage = leakage current at the pin due to = interconnect resistance = sampling switch resistance = sample/hold capacitance (from DAC) various junctions Note: CPIN value depends on device package and is not tested. Effect of CPIN negligible if Rs ≤5 kΩ. RSS ≤3 kΩ |
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