Datasheet

8

Rev 1.0, 2010-12

TLE4906-2K

Specification

3

Specification

3.1

Absolute Maximum Ratings

Note: Stresses above the max. values listed here may cause permanent damage to the device. Exposure to

absolute maximum rating conditions for extended periods may affect device reliability. Maximum ratings are

absolute ratings; exceeding only one of these values may cause irreversible damage to the integrated circuit.

Table 2

Absolute Maximum Rating Parameters

Parameter

Symbol

Limit Values

Unit

Note / Test Condition

Min.

Max.

Supply voltage

-18

-18

-18

18

24

26

V

Supply current through

protection device

-50

50

mA

Output voltage

-0.7

-0.7

18

26

V

for 5min @ 1.2k

Ω pull up

Continuous output current

-50

50

mA

Junction temperature

–

–

–

–

155

165

175

195

°C

for 2000h (not additive)

for 1000h (not additive)

for 168h (not additive)

for 3 x 1h (additive)

Storage temperature

-40

150

°C

Magnetic flux density

B

–

unlimited mT

Table 3

1) Human Body Model (HBM) tests according to: EOS/ESD Association Standard S5.1-1993 and Mil. Std. 883D method

3015.7

Parameter

Symbol

Limit Values

Unit

Note / Test Condition

Min.

Max.

ESD Voltage

±4

kV

HBM, R = 1.5k

Ω,

C = 100pF