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SML50B26F Datasheet(PDF) 2 Page - Seme LAB |
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SML50B26F Datasheet(HTML) 2 Page - Seme LAB |
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2 / 5 page ![]() SML50B26F 8/99 Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Characteristic Test Conditions Min. Typ. Max. Unit Ciss Coss Crss Qg Qgs Qgd td(on) tr td(off) tf Characteristic Test Conditions Min. Typ. Max. Unit 26 104 1.3 5 250 500 1.3 4.5 12 18 IS ISM VSD dv / dt trr Qrr Irrm (Body Diode) (Body Diode) VGS = 0V , IS = – ID [Cont.] IS ≤ ID [cont] dI / dt = 100A/µs VDD ≤ VDSS VR = 200V TJ ≤ 150°C RG = 2.0Ω IS = – ID [Cont.] TJ = 25°C dI / dt = 100A/ µsT J = 125°C IS = – ID [Cont.] TJ = 25°C dl / dt = 100A/ µsT J = 125°C IS = – ID [Cont.] TJ = 25°C dl / dt = 100A/ µsT J = 125°C Continuous Source Current Pulsed Source Current1 Diode Forward Voltage2 Peak Diode Recovery Reverse Recovery Time Reverse Recovery Charge Peak Recovery Current A V V/ns ns µC A SOURCE – DRAIN DIODE RATINGS AND CHARACTERISTICS Input Capacitance Output Capacitance Reverse Transfer Capacitance Total Gate Charge3 Gate – Source Charge Gate – Drain (“Miller”) Charge Turn–on Delay Time Rise Time Turn-off Delay Time Fall Time VGS = 0V VDS = 25V f = 1MHz VGS = 10V VDD = 0.5 VDSS ID = ID [Cont.] @ 25°C VGS = 15V VDD = 0.5 VDSS ID = ID [Cont.] @ 25°C RG = 1.8Ω pF nC ns 3700 4440 510 715 200 300 150 225 25 37 70 105 12 25 10 20 50 75 815 Characteristic Test Conditions Min. Typ. Max. Unit BVDSS IDSS IGSS VGS(TH) ID(ON) RDS(ON) VGS = 0V , ID = 250µA VDS = VDSS VDS = 0.8VDSS , TC = 125°C VGS = ±30V , VDS = 0V VDS = VGS , ID = 1.0mA VDS > ID(ON) x RDS(ON) Max VGS = 10V VGS = 10V , ID = 0.5 ID [Cont.] Drain – Source Breakdown Voltage Zero Gate Voltage Drain Current (VGS = 0V) Gate – Source Leakage Current Gate Threshold Voltage On State Drain Current 2 Drain – Source On State Resistance 2 500 25 250 ±100 24 26 0.20 V µA nA V A Ω STATIC ELECTRICAL RATINGS (Tcase = 25°C unless otherwise stated) DYNAMIC CHARACTERISTICS |
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