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SSD95N03 Datasheet(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
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SSD95N03 Datasheet(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
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2 / 4 page ![]() SSD95N03 96A , 30V , RDS(ON) 4m N-Ch Enhancement Mode Power MOSFET Elektronische Bauelemente 24-Nov-2011 Rev. A Page 2 of 4 http://www.SeCoSGmbH.com/ Any changes of specification will not be informed individually. ELECTRICAL CHARACTERISTICS (TJ=25°C unless otherwise specified) Parameter Symbol Min. Typ. Max. Unit Teat Conditions Static Drain-Source Breakdown Voltage BVDSS 30 - - V VGS=0, ID=250µA Breakdown Voltage Temperature Coefficient △BVDSS /△TJ - 0.0213 - V / °C Reference to 25°C, ID=1mA Gate-Threshold Voltage VGS(th) 1.0 - 2.5 V VDS=VGS, ID=250µA Forward Transconductance gfs - 26.5 - S VDS=5V, ID=30A Gate-Source Leakage Current IGSS - - ±100 nA VGS= ±20V Drain-Source Leakage Current TJ =25°C IDSS - - 1 µA VDS=24V, VGS=0 TJ =55°C - - 5 V DS=24V, VGS=0 Static Drain-Source On-Resistance 2 RDS(ON) - 3.4 4 m VGS=10V, ID=30A - 5.2 6 VGS=4.5V, ID=15A Total Gate Charge Qg - 31.6 - nC ID=15A VDS=15V VGS=4.5V Gate-Source Charge Qgs - 8.6 - Gate-Drain (“Miller”) Change Qgd - 11.7 - Turn-on Delay Time Td(on) - 9 - nS VDD=15 V ID=15A VGS=10V RG=3.3 Rise Time Tr - 19 - Turn-off Delay Time Td(off) - 58 - Fall Time Tf - 15.2 - Input Capacitance Ciss - 3075 4000 pF VGS =0 VDS=15 V f =1.0MHz Output Capacitance Coss - 400 530 Reverse Transfer Capacitance Crss - 315 - Guaranteed Avalanche Characteristics Single Pulse Avalanche Energy 5 EAS 98 - - mJ VDD=25V,L=0.1mH , IAS=30A Source-Drain Diode Diode Forward Voltage 2 VSD - - 1.2 V IS=30A, VGS=0 Continuous Source Current 1,6 IS - - 96 A VD=VG=0, Force Current Pulsed Source Current 2,6 ISM - - 192 A Notes: 1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper. 2. The data tested by pulsed , pulse width≦300µs , duty cycle≦2% 3. The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=53.8A 4. The power dissipation is limited by 175°C junct ion temperature 5. The Min. value is 100% EAS tested guarantee. 6. The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation. |
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