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SFP50N06 Datasheet(PDF) 2 Page - Shenzhen Winsemi Microelectronics Co., Ltd |
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SFP50N06 Datasheet(HTML) 2 Page - Shenzhen Winsemi Microelectronics Co., Ltd |
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2 / 7 page ![]() Steady, Steady, Steady, Steady, keep keep keep keep you you you you advance advance advance advance 2/7 SFP50N06 SFP50N06 SFP50N06 SFP50N06 Electrical Characteristics (Tc = 25°C) Characteristics Symbol Test Condition Min Type Max Unit Gate leakage current IGSS VGS = ±20 V, VDS = 0 V - - ±100 nA Gate−source breakdown voltage V(BR)GSS IG = ±10 μA, VDS = 0 V ±20 - - V Drain cut−off current IDSS VDS = 60 V, VGS = 0 V - - 1 μA VDS = 60 V, Tc = 125°C - - 250 μA Drain−source breakdown voltage V(BR)DSS ID = 250 μA, VGS = 0 V 60 - - V Gate threshold voltage VGS(th) VDS = 10 V, ID =250 μA 2 - 4 V Drain−source ON resistance RDS(ON) VGS = 10 V, ID = 25A - 20 22 mΩ Forward Transconductance gfs VDS=25V, ID = 25A - 22 - s Input capacitance Ciss VDS = 25 V, VGS = 0 V, f = 1 MHz - 1180 1540 pF Reverse transfer capacitance Crss - 64 91 Output capacitance Coss - 440 580 Switching time Rise time tr V DD=30V I D =25A R G =25 Ω V GS = 10V (Note4,5) - 15 40 ns Turn−on time ton - 105 220 Fall time tf - 60 130 Turn−off time toff - 65 140 Total gate charge (gate−source plus gate−drain) Qg VDD =48 V, VGS = 10 V, ID =50 A (Note4,5) - 31 41 nC Gate−source charge Qgs - 8 - Gate−drain (“miller”) Charge Qgd - 13 - Source−Drain Ratings and Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Type Max Unit Continuous drain reverse current IDR - - - 59 A Pulse drain reverse current IDRP - - - 200 A Forward voltage (diode) VDSF IDR =35A, VGS = 0 V - - 1.5 V Reverse recovery time trr IDR =35A, VGS = 0 V, dIDR / dt = 100 A / μs - 52 - ns Reverse recovery charge Qrr - 75 - μC Note 1.Repeativity rating :pulse width limited by junction temperature 2.L=0.5mH,IAS=25A,VDD=25V,VGS=10V,Starting TJ=25℃ 3.ISD≤25A,di/dt≤380A/us, VDD<BVDSS,STARTING TJ=25℃ 4.Pulse Test: Pulse Width≤300us,Duty Cycle≤2% 5.Essentially independent of operating temperature. |
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