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LTC1871 Datasheet(PDF) 18 Page - Linear Technology |
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LTC1871 Datasheet(HTML) 18 Page - Linear Technology |
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18 / 36 page ![]() LTC3787 18 3787fc APPLICATIONS INFORMATION Power MOSFET Selection Two external power MOSFETs must be selected for each controller in the LTC3787: one N-channel MOSFET for the bottom (main) switch, and one N-channel MOSFET for the top (synchronous) switch. The peak-to-peak gate drive levels are set by the INTVCC voltage. This voltage is typically 5.4V during start-up (see EXTVCC pin connection). Consequently, logic-level threshold MOSFETs must be used in most applications. Pay close attention to the BVDSS specification for the MOSFETs as well; many of the logic level MOSFETs are limited to 30V or less. Selection criteria for the power MOSFETs include the on-resistance RDS(ON), Miller capacitance CMILLER, input voltage and maximum output current. Miller capacitance, CMILLER, can be approximated from the gate charge curve usually provided on the MOSFET manufacturer’s data sheet. CMILLER is equal to the increase in gate charge along the horizontal axis while the curve is approximately flat divided by the specified change in VDS. This result is then multiplied by the ratio of the application applied VDS to the gate charge curve specified VDS. When the IC is operating in continuous mode, the duty cycles for the top and bottom MOSFETs are given by: Main Switch Duty Cycle = V OUT − VIN V OUT Synchronous Switch Duty Cycle = V IN V OUT If the maximum output current is IOUT(MAX) and each chan- nel takes one half of the total output current, the MOSFET power dissipations in each channel at maximum output current are given by: P MAIN = (V OUT − VIN )VOUT V 2 IN • I OUT(MAX) 2 ⎛ ⎝⎜ ⎞ ⎠⎟ 2 •1 +δ () •R DS(ON) + k• V 3 OUT • I OUT(MAX) 2• V IN •C MILLER •f P SYNC = V IN V OUT • I OUT(MAX) 2 ⎛ ⎝⎜ ⎞ ⎠⎟ 2 •1 +δ ()•R DS(ON) where δ is the temperature dependency of RDS(ON) (ap- proximately 1Ω) is the effective driver resistance at the MOSFET’s Miller threshold voltage. The constant k, which accounts for the loss caused by reverse recovery current, is inversely proportional to the gate drive current and has an empirical value of 1.7. Both MOSFETs have I2R losses while the bottom N-channel equation includes an additional term for transition losses, which are highest at low input voltages. For high VIN the high current efficiency generally improves with larger MOSFETs, while for low VIN the transition losses rapidly increase to the point that the use of a higher RDS(ON)device with lower CMILLER actually provides higher efficiency. The synchronous MOSFET losses are greatest at high input voltage when the bottom switch duty factor is low or dur- ing overvoltage when the synchronous switch is on close to 100% of the period. The term (1+ δ) is generally given for a MOSFET in the form of a normalized RDS(ON) vs Temperature curve, but δ = 0.005/°C can be used as an approximation for low voltage MOSFETs. |
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