CDCV304-EP

SCAS927A – MARCH 2012

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

ORDERABLE PART NUMBER

TOP-SIDE MARKING

VID NUMBER

–40°C to 105°C

TSSOP - PW

CDCV304TPWREP

C304T

V62/12618-01XE

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

Web site at www.ti.com.

TERMINAL FUNCTIONS

TERMINAL

I/O

DESCRIPTION

NAME

NO.

1Y[0:3]

3, 5, 7, 8

O

Buffered output clocks

CLKIN

1

I

Input reference frequency

GND

4

Power

Ground

OE

2

I

Output enable control

6

Power

Supply

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted)

(1)

UNIT

–0.5 V to 4.3 V

(2) (3)

(2) (3)

±50 mA

±50 mA

±50 mA

–65°C to 150°C

(1)

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating

conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

(3)

This value is limited to 4.6 V maximum.

2

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