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AMC1204B Datasheet(PDF) 2 Page - Texas Instruments

Part # AMC1204B
Description  20MHz, Second-Order, Isolated Delta-Sigma Modulator for Current-Shunt Measurement
PDF  32 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

AMC1204B Datasheet(HTML) 2 Page - Texas Instruments

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AMC1204
AMC1204B
SBAS512C – APRIL 2011 – REVISED AUGUST 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
For the most current package and ordering information see the Package Option Addendum at the end of this
document, or visit the device product folder on www.ti.com.
FAMILY OVERVIEW
MODULATOR
DIGITAL
GAIN ERROR
PART NUMBER
CLOCK (MHz)
SUPPLY
CLOCK SOURCE
INL (LSB)
(%)
THD (dB)
AMC1203
10
5V
Internal
±9
±2
–84.5
AMC1203B
10
5V
Internal
±6
±1
–88
AMC1204
20
3V, 3.3V, or 5V
External
±8
±2
–80
AMC1204B
20
3V, 3.3V, or 5V
External
±8
±2
–80
ABSOLUTE MAXIMUM RATINGS
(1)
Over the operating ambient temperature range, unless otherwise noted.
AMC1204, AMC1204B
PARAMETER
MIN
MAX
UNIT
Supply voltage, AVDD to AGND or DVDD to DGND
–0.3
+6
V
Analog input voltage at VINP, VINN
AGND – 0.5
AVDD + 0.5
V
Digital input voltage at CLKIN
DGND – 0.3
DVDD + 0.3
V
Input current to any pin except supply pins
–10
+10
mA
Maximum virtual junction temperature, TJ
+150
°C
Operating ambient temperature range, TOA
–40
+125
°C
Human body model (HBM)
–3000
+3000
V
JEDEC standard 22, test method A114-C.01
Electrostatic discharge (ESD),
Charged device model (CDM)
–1500
+1500
V
all pins
JEDEC standard 22, test method C101
Machine model (MM)
–200
+200
V
JEDEC standard 22, test method A115A
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under the Electrical Characteristics
is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
THERMAL INFORMATION
AMC1204,
AMC1204B
THERMAL METRIC(1)
UNITS
DW
16 PINS
θJA
Junction-to-ambient thermal resistance
78.5
θJCtop
Junction-to-case (top) thermal resistance
41.3
θJB
Junction-to-board thermal resistance
50.2
°C/W
ψJT
Junction-to-top characterization parameter
11.5
ψJB
Junction-to-board characterization parameter
41.2
θJCbot
Junction-to-case (bottom) thermal resistance
n/a
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
2
Submit Documentation Feedback
Copyright © 2011–2012, Texas Instruments Incorporated
Product Folder Links: AMC1204 AMC1204B



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