3

2

4

5

1

NC

Y

A

GND

DBV PACKAGE

(TOP VIEW)

DCK PACKAGE

(TOP VIEW)

3

2

4

5

1

NC

Y

A

GND

See mechanical drawings for dimensions.

3

2

4

5

1

NC

Y

A

GND

DRL PACKAGE

(TOP VIEW)

YZP PACKAGE

(BOTTOM VIEW)

DNU

GND

Y

A

1

4

2

3

5

DNU − Do not use

YZV PACKAGE

(BOTTOM VIEW)

GND

Y

A

3

1

2

4

NC − No internal connection

DRY PACKAGE

(TOP VIEW)

NC

GND

Y

A

NC

5

4

6

1

2

3

NC

GND

DSF PACKAGE

(TOP VIEW)

A

V

CC

Y

NC

6

5

4

2

3

1

SN74LVC1G14

www.ti.com

SCES647A

– SEPTEMBER 2005 – REVISED JUNE 2011

SINGLE SCHMITT-TRIGGER INVERTER

Check for Samples: SN74LVC1G14

1

FEATURES

2

•

Available in the Texas Instruments NanoStar

™

•

Latch-Up Performance Exceeds 100 mA Per

and NanoFree

™ Packages

JESD 78, Class II

•

•

ESD Protection Exceeds JESD 22

•

Inputs Accept Voltages to 5.5 V

– 2000-V Human-Body Model (A114-A)

•

– 200-V Machine Model (A115-A)

•

Low Power Consumption, 10-

– 1000-V Charged-Device Model (C101)

•

±24-mA Output Drive at 3.3 V

•

Down Mode, and Back Drive Protection

DESCRIPTION/ORDERING INFORMATION

The SN74LVC1G14 device contains one inverter and performs the Boolean function Y = A. The device functions

as an independent inverter, but because of Schmitt action, it may have different input threshold levels for

NanoStar

™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the

die as the package.

preventing damaging current backflow through the device when it is powered down.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

NanoStar, NanoFree are trademarks of Texas Instruments.

PRODUCTION DATA information is current as of publication date.

Copyright

© 2005–2011, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.