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LMP91050MM Datasheet(PDF) 6 Page - Texas Instruments

Part # LMP91050MM
Description  LMP91050 Configurable AFE for Nondispersive Infrared (NDIR) Sensing Applications
PDF  23 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

LMP91050MM Datasheet(HTML) 6 Page - Texas Instruments

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LMP91050
SNAS517D – NOVEMBER 2011 – REVISED MARCH 2013
www.ti.com
Electrical Characteristics
(1) (continued)
The following specifications apply for VDD = 3.3V, VCM = 1.15V, Bold values for TA = -40°C to +85°C unless otherwise
specified. All other limits apply to TA = TJ = +25°C.
Symbol
Parameter
Conditions
Min (2)
Typ (3)
Max (2)
Units
Gain = 167 V/V
–0.525
0.525
Gain = 335 V/V
–0.60
0.60
Gain = 669 V/V
–0.90
0.90
Gain = 1335 V/V
–1.50
1.50
Output Offset Voltage
TCVOS
mV/°C
Temperature Drift (5)
Gain = 1002 V/V
–1.20
1.20
Gain = 2004 V/V
–1.90
1.90
Gain = 4003 V/V
–3.70
3.70
Gain = 7986V/V
–7.10
7.10
Common Mode Generator
1.15 or
VCM
Common Mode Voltage
V
Programmable, see Common Mode Generation
2.59
VCM accuracy
2
%
CLOAD
CMOut Load Capacitance
10
nF
SPI Interface
(1)
The following specifications apply for VDD = 3.3V, VCM = 1.15V, CL = 15pF, Bold values for TA = -40°C to +85°C unless
otherwise specified. All other limits apply to TA = TJ = +25°C.
Min
Typ
Max
Symbol
Parameter
Conditions
Units
(2)
(3)
(2)
0.7
VIH
Logic Input High
V
× VDD
VIL
Logic Input Low
0.8
V
VOH
Logic Output High
2.6
V
VOL
Logic Output Low
0.4
V
–100
100
IIH/IIL
Input Digital Leakage Current
nA
–200
200
(1)
Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2)
Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using
statistical quality control (SQC) method.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
Timing Characteristics
(1)
The following specifications apply for VDD = 3.3V, VCM = 1.15V, CL = 15pF, Bold values for TA = -40°C to +85°C unless
otherwise specified. All other limits apply to TA = TJ = +25°C.
Min
Typ
Max
Symbol
Parameter
Conditions
Units
(2)
(3)
(2)
tWU
Wake up time
1
ms
fSCLK
Serial Clock Frequency
10
MHz
(1)
Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2)
Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using
statistical quality control (SQC) method.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
6
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Copyright © 2011–2013, Texas Instruments Incorporated
Product Folder Links: LMP91050



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