THS8083APZP datasheet(46/63 Pages) TI

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6−3

6.4

Electrical Characteristics Over Recommended Operating Free-Air Temperature

Range, TA = 0°C to 70°C (unless otherwise noted)

NOTE: In order to reach stated performance levels, the device’s PowerPad feature should be

thermally and electrically connected to the pcb ground plane, as described in Section 6.1

Designing With PowerPad.

6.4.1

Power Supply (3.3 V All Supplies)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Analog supply (=AVDD_CH1+AVDD_CH2_3+AVDD_PLL+AVDD_REF)

ADC_INTREF

325

385

Analog supply (=AVDD_CH1+AVDD_CH2_3+AVDD_PLL+AVDD_REF)

ADC_INTREF

325

385

Digital supply (=DVDD+DVDD_PLL)

ADC_INTREF

119

140

Digital supply (=DVDD+DVDD_PLL)

ADC_INTREF

119

140

Total power dissipation normal operation

ADC_INTREF

1.47

1.73

Total power dissipation normal operation

ADC_INTREF

1.47

1.73

Total power dissipation, power down all modes

ADC_PWDN

385

Total power dissipation, power down all modes

ADC_PWDN

385

6.4.2

Digital Logic Inputs (HS, VS, SCL, SDA, I2CA, XTL1_MCLK, EXT_ADCCLK, OE, RESET,

EXT_CLP)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

IIH

High-level input current

−10

µA

IIL

Low-level input current

DVDD = 3.6 V,

Digital inputs and CLK at 0 V for IIL;

−10

µA

IIL(CLK)

Low-level input current, CLK (see Note 6)

Digital inputs and CLK at 0 V for IIL;

Digital inputs and CLK at 3.6 V for IIH

−14

µA

IIH(CLK) High-level input current , CLK (see Note 6)

Digital inputs and CLK at 3.6 V for IIH

−14

µA

Input capacitance

NOTE 6: Applies when XTL1_MCLK is driven by the clock signal directly.

6.4.3

Logic Outputs (SDA, CHn_OUTA[7..0], CHn_OUTB[7..0], DTOCLK3, ADCCLK2,

DATACLK1, DHS, LOCK)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VOH

High-level output voltage

DVDD = 3 V at IOH = 50 µA,

Digital output forced high

2.9

VOL

Low-level output voltage

DVDD = 3.6 V at IOL = 50 µA,

Digital output forced low

0.15

Output capacitance

IOZ(H)/IOZ(L)†

High-impedance-state output current

DVDD = 3.6 V

Worst case for VO = 3.6 V and VO = 0 V

−10

µA

† Tested for CHn-A[7..0] and CHn_B[7..0] only

THS8083APZP Datasheet(PDF) 46 Page - Texas Instruments

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