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SSM0410S Datasheet(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH

Part # SSM0410S
Description  N-Channel Enhancement Mode Power MOSFET
PDF  4 Pages
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Manufacturer  SECOS [SeCoS Halbleitertechnologie GmbH]
Direct Link  http://www.secosgmbh.com
Logo SECOS - SeCoS Halbleitertechnologie GmbH

SSM0410S Datasheet(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH

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Elektronische Bauelemente
SSM0410S
3A , 100V , RDS(ON) 310 m
N-Channel Enhancement Mode Power MOSFET
27-Jun-2013 Rev.B
Page 2 of 4
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise specified)
Parameter
Symbol
Min.
Typ.
Max.
Unit
Teat Conditions
Static
Drain-Source Breakdown Voltage
BVDSS
100
-
-
V
VGS=0, ID= 250μA
Gate-Threshold Voltage
VGS(th)
1
-
2.5
V
VDS=VGS, ID=250μA
Forward Transconductance
gfs
-
4
-
S
VDS=5V, ID=2A
Gate-Source Leakage Current
IGSS
-
-
±100
nA
VGS= ±20V
-
-
1
VDS=80V, VGS=0, TJ=25°C
Drain-Source Leakage Current
IDSS
-
-
5
μA
VDS=80V, VGS=0, TJ=55°C
-
-
310
VGS=10V, ID=3A
Static Drain-Source On-Resistance
2
RDS(ON)
-
-
320
mΩ
VGS=4.5V, ID=1.7A
Total Gate Charge(10V)
Qg
-
9.1
-
Gate-Source Charge
Qgs
-
2
-
Gate-Drain Change
Qgd
-
1.4
-
nC
ID=2A
VDS=50V
VGS=10V
Turn-on Delay Time
2
Td(on)
-
2
-
Rise Time
Tr
-
21.6
-
Turn-off Delay Time
Td(off)
-
11.2
-
Fall Time
Tf
-
18.8
-
nS
VDD=50V
ID=2A
VGS=10V
RG=3.3Ω
RL=30Ω
Input Capacitance
Ciss
-
508
-
Output Capacitance
Coss
-
29
-
Reverse Transfer Capacitance
Crss
-
16.4
-
pF
VGS =0
VDS=15V
f =1.0MHz
Source-Drain Diode
Diode Forward Voltage
2
VSD
-
-
1.2
V
IS=1A, VGS=0, TJ=25°C
Continuous Source Current
1,4
IS
-
-
3
A
Pulsed Source Current
2,4
ISM
-
-
5.5
A
VD=VG=0, Force Current
Reverse Recovery Time
Trr
-
17.5
-
nS
Reverse Recovery Charge
Qrr
-
14
-
nC
IF=2A, dl/dt=100A/μS,
TJ=25°C
Note:
1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2. The data tested by pulsed , pulse width ≦ 300μs , duty cycle ≦ 2%
3. The power dissipation is limited by 150°C, junction temperature.
4. The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.



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