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SSF2129H3 Datasheet(PDF) 3 Page - Silikron Semiconductor Co.,LTD. |
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SSF2129H3 Datasheet(HTML) 3 Page - Silikron Semiconductor Co.,LTD. |
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3 / 7 page ![]() SSF2129H3 ©Silikron Semiconductor CO., LTD. 2013.01.22 Version: 1.0 page 3 of 7 www.silikron.com Test circuits and Waveforms Switch Waveforms: Notes: ①Calculated continuous current based on maximum allowable junction temperature. ②Repetitive rating; pulse width limited by max junction temperature. ③The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C ④These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=150°C. Gate charge test circuit: S Switching time test circuit: EAS test circuit: |
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