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SSFN2569 Datasheet(PDF) 5 Page - Silikron Semiconductor Co.,LTD. |
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SSFN2569 Datasheet(HTML) 5 Page - Silikron Semiconductor Co.,LTD. |
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5 / 6 page  SSFN2569 ©Silikron Semiconductor CO., LTD. 2013.06.07 Version: 1.0 page 5 of 6 www.silikron.com Ordering and Marking Information Device Marking: SSFN2569 Package (Available) DFN3X2-8L Operating Temperature Range C : -55 to 150 ºC Devices per Unit Package Type Units/ Tape Tapes/Inner Box Units/Inner Box Inner Boxes/Carton Box Units/Carton Box DFN3X2-8L 3000 5 15000 4 60000 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) Tj=125℃ or 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices High Temperature Gate Bias(HTGB) Tj=125℃ or 150℃ @ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices |
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