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HT27C512 Datasheet(PDF) 5 Page - Holtek Semiconductor Inc |
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HT27C512 Datasheet(HTML) 5 Page - Holtek Semiconductor Inc |
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5 / 10 page  Programming operation Ta=+25 °C±5°C Symbol Parameter Test Conditions Min. Typ. Max. Unit VCC Conditions tAS Address Setup Time 5.8V — 2 — — µs tOES CE/VPP Setup Time 5.8V — 2 — — µs tOEH OE/VPP Hold Time 5.8V — 2 — — µs tDS Data Setup Time 5.8V — 2 — — µs tAH Address Hold Time 5.8V — 0 — — µs tDH Data Hold Time 5.8V — 2 — — µs tDFP Output Enable to Output Float Delay 5.8V — 0 — 130 ns tPW PGM Program Pulse Width 5.8V — 30 75 105 µs tVCS VCC Setup Time 5.8V — 2 — — µs tDV Data Valid From CE 5.8V — — — 150 ns tVR OE/VPP Recovery Time 5.8V — 2 — — µs Test waveforms and measurements For -70, -90 devices: Output test load Note: CL=100pF including jig capacitance, except for the -45 devices, where CL=30pF. tR, tF< 20ns (10% to 90%) 1.3V (1N914) 3.3k Ω Output Pin CL HT27C512 5 6th May ’99 |
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