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IDT49FCT806ASOB Datasheet(PDF) 3 Page - Integrated Device Technology

Part # IDT49FCT806ASOB
Description  FAST CMOS BUFFER/CLOCK DRIVER
PDF  7 Pages
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT49FCT806ASOB Datasheet(HTML) 3 Page - Integrated Device Technology

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IDT49FCT805/806/A
FAST CMOS BUFFER/CLOCK DRIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
9.1
3
ABSOLUTE MAXIMUM RATINGS
(1)
CAPACITANCE (TA = +25
°C, f = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
2574 lnk 04
Symbol
Parameter(1)
Conditions
Typ.
Max.
Unit
CIN
Input
Capacitance
VIN = 0V
4.5
6.0
pF
COUT
Output
Capacitance
VOUT = 0V
5.5
8.0
pF
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V
Commercial: TA = 0
°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2.0
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
II H
Input HIGH Current(5)
VCC = Max.
VI = VCC
——
±1
µA
II L
Input LOW Current(5)
VCC = Max.
VI = GND
——
±1
µA
IOZH
Off State (HIGH Z)(5)
VCC = Max.
VO = VCC
——
±1
µA
IOZL
Output Current(5)
VO = GND
——
±1
µA
VIK
Clamp Diode Voltage
VCC = Min., IIN= –18mA
—
–0.7
–1.2
V
IOS
Short Circuit Current
VCC = Max.(3), VO = GND
–60
–120
—
mA
VOH
Output HIGH Voltage
VCC = 3V, VIN = VLC or VHC, IOH = –32
µAVHC
VCC
—V
VCC = Min.
IOH = –300
µAVHC
VCC
—
VIN = VIH or VIL
IOH = –12mA MIL.
IOH = –15mA COM'L.
3.6
4.3
—
IOH
= -24mA MIL.
IOH
= -24mA COM'L.
2.4
3.8
—
VOL
Output LOW Voltage
VCC = 3V, VIN = VLC or VHC, IOL= 300
µA
—
GND
VLC
V
VCC = Min.
IOH = 300
µA
—
GND
VLC(4)
VIN = VIH or VIL
IOL = 48mA MIL.
—
0.3
0.55
IOL = 64mA COM'L.
VH
Input Hysteresis for all inputs
—
—
200
—
mV
ICC
Quiescent Power Supply Current
VCC = Max., VIN = GND or VCC
—
5
500
µA
NOTES:
2574 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25
°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
5. The test limit for this parameter is
± 5µA at TA = –55°C.
NOTE:
2574 tbl 02
1. H = HIGH, L = LOW, Z = High Impedance
FUNCTION TABLE
(1)
Outputs
Inputs
49FCT805
49FCT806
OE
OEA, OE
OEB INA, INB OAn, OBn
MON
OA
OAn, OB
OBn
MON
MON
LLLL
H
H
L
HHH
L
L
HL
ZL
Z
H
HH
ZH
Z
L
Symbol
Description
Max.
Unit
VTERM(2) Terminal Voltage with Respect to
GND
–0.5 to +7.0
V
VTERM(3) Terminal Voltage with Respect to
GND
–0.5 to
VCC +0.5
V
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current
–60 to +120
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect reliability. No terminal voltage may exceed
VCC by +0.5V unless otherwise noted.
2. Input and VCC terminals.
3. Output and I/O terminals.
2574 lnk 03



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