| Electronic Components Datasheet Search |
|
AN900 Datasheet(PDF) 12 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
AN900 Datasheet(HTML) 12 Page - STMicroelectronics |
|
12 / 15 page ![]() 12/15 INTRODUCTION TO SEMICONDUCTOR TECHNOLOGY Most of the early semiconductor devices were made with PMOS technologies because it was easier to obtain stable manufacturing process with this technology. As higher speeds and greater densities were needed, new devices were implemented with NMOS. This was due to the higher speed of N-channel charge carriers (electrons) in silicon and also to the progress in the control of silicon doping. But CMOS technology has begun to see widespread commercial use in memory devices: it allowed the use of very low power devices. At the beginning, CMOS were slower than NMOS devices. Today, CMOS technology has been improved to produce higher speed devices. 2.2 FABRICATION OF A TRANSISTOR The fabrication begins with a slice of single crystal silicon, uniformly doped P-type. The wafer is oxidized in a furnace to grow a thin layer of silicon dioxide (SiO2) on the surface. Sil- icon nitride is then deposited on the oxidized wafer in a gas phase chemical reactor. The wafer is now ready to receive the first pattern of what is to become a many layered complex circuit. The first pattern defines the boundaries of the active regions of the integrated circuit, where transis- tors, capacitors, diffused resistors and first level interconnects will be made. The patterned wafer is then implanted with boron atoms. Boron will only reach the etched zones of the silicon substrate, creating P-type doped areas that will electrically separate active areas. Wafer is oxidized again and the thick oxide only grows in the etched areas due to silicon nitride’s properties as an oxidation barrier. The remaining silicon nitride layer is removed. Now that the areas for active transistors have been defined and isolated, the transistor types can be determined. The wafer is patterned and implanted with dopant atoms.The energy and dose at which the dopant atoms are implanted determines much of the transistor’s characteristics. The transistor types defined, the gate oxide of the active transistors are grown in a high temperature furnace. The gate oxide layer is then masked and holes are etched to provide direct access to buried contacts where needed. A polycristaline silicon layer is deposited on the wafer. The gate layer is then patterned to define the actual transistor gates and interconnect paths. |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |