3

RH1086M

PARAMETER

CONDITIONS

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX UNITS

Reference Voltage (Note 5)

1.258

1.230

1.257

1.225

1.253 1.220

1.247

1.205

1.241

V

10mA

1.220

1.275

1.219

1.275

1.215

1.275 1.210

1.275

1.20

1.275

V

1.5V

Line Regulation (Notes 1, 2)

0.2

0.21

0.23

0.25

0.3

%

1.5V

Load Regulation (Notes 1, 2, 5)

0.3

0.3

0.3

0.3

0.3

%

10mA

Dropout Voltage (Note 3)

1.5

1.51

1.52

1.55

1.575

V

Current Limit

1.5

1.5

1.5

1.5

1.5

A

0.05

0.049

0.048

0.047

0.045

A

0.5

0.5

0.5

0.5

0.5

A

0.020

0.019

0.019

0.018

0.017

A

Minimum Load Current

10

10

10

10

10

mA

Adjust Pin Current

120

120

120

120

120

µA

Adjust Pin Current Change

10mA

55

5

5

5

µA

(Note 5)

1.5V

10KRAD(Si)

20KRAD(Si)

50KRAD(Si)

100KRAD(Si)

200KRAD(Si)

Note 1: See thermal regulation specifications for changes in output voltage

due to heating effects. Line and load regulation are measured at a constant

junction temperature by low duty cycle pulse testing.

Note 2: Line and load regulation are guaranteed up to the maximum power

dissipation of 15W for RH1086MK and 3W for the RH1086MH. Power

dissipation is determined by the input/output differential voltage and the

output current. Guaranteed maximum power dissipation will not be

available over the full input/output voltage range.

Note 3: Dropout voltage is specified over the full output current range of

the device. Test points and limits are shown on the Dropout Voltage curve

in the LT

Note 4: Guaranteed by design, characterization, or correlation to other

tested parameters.

data sheet. For compliance with 883 revision C current density

specifications, the RH1086MK is derated to 1A.

TABLE 2: ELECTRICAL TEST REQUIRE E TS

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1,

tests after cooldown as the final electrical test in accordance with method

5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup

1, after burn-in divided by the total number of devices submitted for burn-

in in that lot shall be used to determine the percent for the lot.

Linear Technology Corporation reserves the right to test to tighter limits

than those given.

MIL-STD-883 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements (Method 5004)

1*,2,3,4,5,6

Group A Test Requirements (Method 5005)

1,2,3,4,5,6

Group C and D End Point Electrical Parameters

1

(Method 5005)

* PDA Applies to subgroup 1. See PDA Test Notes.

Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However,

no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the

interconnection of circuits as described herein will not infringe on existing patent rights.