서식Rev: 01

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16

Reliability

1. Relative Spectral Power Distribution

2. Failure Criteria

Test Item

Standard

Test Method

Test Condition

Duration

/cycle

Number

of

damage

High Temp.

Operational Life

Internal

Reference

Ta=85℃, IF=500mA

1000hrs

0/5

Room Temp.

Operational Life

Internal

Reference

Ta=25℃, IF=500mA

1000hrs

0/5

High Temp.

Storage

EIAJ ED-4701

Ta = 100℃

1000hrs

0/22

Thermal shock

EIAJ ED-4701

Ta max=120℃, Ta min=-40℃

30min dwell/transfer time : 10sec,

1 cycle=1hr

200 cycles

0/22

Resistance to

Soldering

EIAJ ED-4701

Temp=260±5℃, Time : 10±1 sec

1 time

0/10

ESD

EIAJ ED-4701

R=1.5kΩ, C=100pF

Voltage level=2kV

3 times

Negative

/positive

0/22

Parameter

Symbol

Test Conditions

Max. or Min.

allowable shift value

Forward

Voltage

IF=500mA

Max. Initial measurement x 1.2

Radiant Flux

IF=500mA

Min. Initial measurement x 0.7

Notes :

1. The value is measured after the test sample is cooled down to the room temperature.