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BLF2425M7L100 Datasheet(PDF) 3 Page - NXP Semiconductors |
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BLF2425M7L100 Datasheet(HTML) 3 Page - NXP Semiconductors |
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3 / 13 page ![]() BLF2425M7L100_2425M7LS100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 1 — 6 December 2013 3 of 13 NXP Semiconductors BLF2425M7L(S)100 Power LDMOS transistor 6. Characteristics 7. Test information 7.1 Ruggedness in class-AB operation The BLF2425M7L100 and BLF2425M7LS100 are capable of withstanding a load mismatch corresponding to VSWR = 10 : 1 through all phases under the following conditions: VDS =28 V; IDq =900 mA; PL = 100 W (CW); f = 2300 MHz. Table 6. DC characteristics Tj = 25 C unless otherwise specified. Symbol Parameter Conditions Min Typ Max Unit V(BR)DSS drain-source breakdown voltage VGS =0 V; ID =1mA 65 - - V VGS(th) gate-source threshold voltage VDS =10 V; ID = 150 mA 1.5 1.8 2.3 V IDSS drain leakage current VGS =0 V; VDS =28V - - 5 A IDSX drain cut-off current VGS =VGS(th) +3.75 V; VDS =10 V 25.1 29 - A IGSS gate leakage current VGS =11 V; VDS = 0 V - - 500 nA gfs forward transconductance VDS =10 V; ID =5.35A - 10.5 - S RDS(on) drain-source on-state resistance VGS =VGS(th) + 3.75 V; ID =5.25A -0.1 - Table 7. RF characteristics Test signal: single carrier IS-95 with pilot, paging, sync and 6 traffic channels (Walsh codes 8 - 13). PAR = 9.7 dB at 0.01 % probability on the CCDF, channel bandwidth is 1.2288 MHz; f1 =2300MHz; f2 = 2400 MHz; RF performance at VDS =28V; IDq = 900 mA; Tcase =25 C; unless otherwise specified; in a class-AB production test circuit. Symbol Parameter Conditions Min Typ Max Unit Gp power gain PL(AV) =20 W 17.3 18 - dB RLin input return loss PL(AV) =20 W - 14 - dB D drain efficiency PL(AV) =20 W 22 27 - % ACPR885k adjacent channel power ratio (885 kHz) PL(AV) =20 W - 46 40 dBc |
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