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LM7332MA/NOPB Datasheet(PDF) 7 Page - Texas Instruments

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Part # LM7332MA/NOPB
Description  Operational Amplifier
PDF  34 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LM7332MA/NOPB Datasheet(HTML) 7 Page - Texas Instruments

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LM7332
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SNOSAV4B – APRIL 2008 – REVISED JANUARY 2016
±5-V Electrical Characteristics (continued)
Unless otherwise specified, all limits are ensured for TA = 25°C, V
+ = +5 V, V− = −5 V, V
CM = 0 V, VO = 0 V, and RL > 1 MΩ to
0 V.
(1)
PARAMETER
TEST CONDITIONS
MIN (2)
TYP (3)
MAX (2)
UNIT
RL = 10 kΩ to 0 V
75
250
VID = 100 mV
At the temperature extremes
300
Output swing
high
RL = 2 kΩ to 0 V
125
350
VID = 100 mV
At the temperature extremes
400
mV from
VO
either rail
RL = 10 kΩ to 0 V
10
250
VID = −100 mV
At the temperature extremes
300
Output swing
low
RL = 2 kΩ to 0V
30
350
VID = −100 mV
At the temperature extremes
400
Sourcing from V+, VID = 200 mV
(6)
90
120
ISC
Output short circuit current
mA
Sinking to V−, VID = −200 mV
(6)
90
100
IOUT
Output current
VID = ±200 mV, VO = 1 V from rails
±65
mA
No Load, VCM = −4.5 V
1.5
2.4
IS
Total supply current
mA
At the temperature extremes
2.6
AV = +1, VI = 8-V step, RL = 1 MΩ,
SR
Slew rate(7)
13.2
V/µs
CL = 10 pF
ROUT
Close-loop output resistance
AV = +1, f = 100 kHz
3
Ω
fu
Unity-gain frequency
RL = 10 MΩ, CL = 20 pF
7.9
MHz
GBWP
Gain bandwidth product
f = 50 kHz
19.9
MHz
en
Input-referred voltage noise
f = 2 kHz
14.7
nV/
√HZ
in
Input-referred current noise
f = 2 kHz
1.3
pA/
√HZ
AV = +2, RL = 100 kΩ, f = 1 kHz
THD+N
Total harmonic distortion + noise
−87
dB
VO = 8 VPP
CT Rej.
Crosstalk rejection
f = 3 MHz, driver RL = 10 kΩ
68
dB
(6)
Short-circuit test is a momentary test. Output short circuit duration is infinite for VS ≤ 6 V at room temperature and below. For VS > 6 V,
allowable short circuit duration is 1.5 ms.
(7)
Slew rate is the slower of the rising and falling slew rates. Connected as a voltage follower.
6.7
±15-V Electrical Characteristics
Unless otherwise specified, all limits are ensured for TA = 25°C, V
+ = +15 V, V− = −15 V, V
CM = 0 V, VO = 0 V, and RL > 1 MΩ
to 0 V.
(1)
PARAMETER
TEST CONDITIONS
MIN (2)
TYP (3)
MAX (2)
UNIT
VCM = −14.5 V and VCM = 14.5 V
−5
±2
5
VOS
Input offset voltage
mV
At the temperature extremes
−6
6
Input offset voltage temperature
VCM = −14.5 V and VCM = 14.5 V
TC VOS
±2
µV/°C
drift
(4)
See (5)
−2
±1
2
IB
Input bias current
µA
At the temperature extremes
−2.5
2.5
(1)
Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in
very limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where TJ > TA.
(2)
All limits are ensured by testing or statistical analysis.
(3)
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped
production material.
(4)
Offset voltage temperature drift determined by dividing the change in VOS at temperature extremes into the total temperature change.
(5)
Positive current corresponds to current flowing in the device.
Copyright © 2008–2016, Texas Instruments Incorporated
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