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REF1925AIDDCT Datasheet(PDF) 5 Page - Texas Instruments

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Part # REF1925AIDDCT
Description  Voltage References
PDF  31 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

REF1925AIDDCT Datasheet(HTML) 5 Page - Texas Instruments

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REF1925, REF1930, REF1933, REF1941
www.ti.com
SBOS697 – SEPTEMBER 2014
7.5
Electrical Characteristics
At TA = 25°C, IL = 0 mA, and VIN = 5 V, unless otherwise noted. Both VREF and VBIAS have the same specifications.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ACCURACY AND DRIFT
Output voltage accuracy
–0.1%
0.1%
Output voltage temperature coefficient(1)
–40°C
≤ TA ≤ 125°C
±10
±25
ppm/°C
–40°C
≤ TA ≤ 85°C
±1.5
±6
ppm/°C
VREF and VBIAS tracking over temperature
(2)
–40°C
≤ TA ≤ 125°C
±2
±7
ppm/°C
LINE AND LOAD REGULATION
ΔVO(ΔVI)
Line regulation
VREF + 0.02 V ≤ VIN ≤ 5.5 V
3
35
ppm/V
0 mA
≤ IL ≤ 20 mA ,
Sourcing
8
20
ppm/mA
VREF + 0.6 V ≤ VIN ≤ 5.5 V
ΔVO(ΔIL)
Load regulation
0 mA
≤ IL ≤ –20 mA,
Sinking
8
20
ppm/mA
VREF + 0.02 V ≤ VIN ≤ 5.5 V
POWER SUPPLY
360
430
µA
Active mode
–40°C
≤ TA ≤ 125°C
460
µA
ICC
Supply current
3.3
5
µA
Shutdown mode
–40°C
≤ TA ≤ 125°C
9
µA
Device in shutdown mode (EN = 0)
0
0.7
V
Enable voltage
Device in active mode (EN = 1)
VIN – 0.7
VIN
V
10
20
mV
Dropout voltage
IL = 20 mA
600
mV
ISC
Short-circuit current
50
mA
ton
Turn-on time
0.1% settling, CL = 1 µF
500
µs
NOISE
Low-frequency noise(3)
0.1 Hz
≤ f ≤ 10 Hz
12
ppmPP
Output voltage noise density
f = 100 Hz
0.25
ppm/
√Hz
CAPACITIVE LOAD
Stable output capacitor range
0
10
µF
HYSTERESIS AND LONG-TERM STABILITY
Long-term stability
0 to 1000 hours
60
ppm
Cycle 1
60
ppm
Output voltage hysteresis(4)
25°C, –40°C, 125°C, 25°C
Cycle 2
35
ppm
(1)
Temperature drift is specified according to the box method. See the Feature Description section for more details.
(2)
The VREF and VBIAS tracking over temperature specification is explained in more detail in the Feature Description section.
(3)
The peak-to-peak noise measurement procedure is explained in more detail in the Noise Performance section.
(4)
The thermal hysteresis measurement procedure is explained in more detail in the Thermal Hysteresis section.
Copyright © 2014, Texas Instruments Incorporated
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Product Folder Links: REF1925 REF1930 REF1933 REF1941



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