CDCL1810

SLLS781D – FEBRUARY 2007 – REVISED NOVEMBER 2014

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8 Specifications

8.1 Absolute Maximum Ratings

(1)

Over operating free-air temperature range (unless otherwise noted).

MIN

MAX

UNIT

–0.3

2.5

V

–0.3

VDD+0.6

V

–0.3

VDD+0.6

V

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

condition is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values are with respect to network ground terminal.

8.2 Handling Ratings

MIN

MAX

UNIT

Storage temperature range

–65

+150

°C

Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all

2000

Electrostatic discharge

V

Charged device model (CDM), per JEDEC specification

1500

(1)

JEDEC document JEP155 states that 2000-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 1500-V CDM allows safe manufacturing with a standard ESD control process.

8.3 Recommended Operating Conditions

Over operating free-air temperature range (unless otherwise noted).

MIN

NOM

MAX

UNIT

Digital supply voltage

1.7

1.8

1.9

V

Analog supply voltage

1.7

1.8

1.9

V

D

Ambient temperature (no airflow, no heatsink)

–40

+85

°C

Junction temperature

+105

°C

8.4 Thermal Information

CDCL1810

RGZ Package

UNIT

48 PINS

28.3, Airflow = 0 LFM

22.4, Airflow = 50 LFM

°C/W

Junction-to-case (top) thermal resistance

20.5

Junction-to-case (bottom) thermal resistance

5.3

(1)

For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.

(2)

No heatsink; power uniformly distributed; 36 ground vias (6 x 6 array) tied to the thermal exposed pad; 4-layer high-K board.

8.5

DC Electrical Characteristics

Over recommended operating conditions (unless otherwise noted).

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Total current from digital 1.8-V supply

212

mA

650MHz LVDS input

Total current from analog 1.8-V supply

16

mA

650MHz LVDS input

Low level CMOS input voltage

–0.2

0.6

V

High level CMOS input voltage

V

6

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