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STM32F303VE Datasheet(PDF) 24 Page - STMicroelectronics |
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STM32F303VE Datasheet(HTML) 24 Page - STMicroelectronics |
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24 / 184 page  Functional overview STM32F303xD STM32F303xE 24/184 DocID026415 Rev 4 3.15 Digital-to-analog converter (DAC) Two 12-bit buffered DAC channels can be used to convert digital signals into analog voltage signal outputs. The chosen design structure is composed of integrated resistor strings and an amplifier in inverting configuration. This digital interface supports the following features: • Two DAC output channels • 8-bit or 10-bit monotonic output • Left or right data alignment in 12-bit mode • Synchronized update capability • Noise-wave generation • Triangular-wave generation • Dual DAC channel independent or simultaneous conversions • DMA capability (for each channel) • External triggers for conversion • Input voltage reference VREF+ 3.16 Operational amplifier (OPAMP) The STM32F303xD/E embed four operational amplifiers with external or internal follower routing and PGA capability (or even amplifier and filter capability with external components). When an operational amplifier is selected, an external ADC channel is used to enable output measurement. The operational amplifier features: • 8.2 MHz bandwidth • 0.5 mA output capability • Rail-to-rail input/output • In PGA mode, the gain can be programmed to be 2, 4, 8 or 16. 3.17 Ultra-fast comparators (COMP) The STM32F303xD/E devices embed seven ultra-fast rail-to-rail comparators with programmable reference voltage (internal or external) and selectable output polarity. The reference voltage can be one of the following: • External I/O • DAC output pin • Internal reference voltage or submultiple (1/4, 1/2, 3/4). Refer to Table 23: Embedded internal reference voltage for the value and precision of the internal reference voltage. All comparators can wake up from STOP mode, generate interrupts and breaks for the timers and can be also combined per pair into a window comparator. |
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