JH24240320E

VER: 1.0

- 13 -

Issue date: 2013/08/12

JEWEL HILL ELECTRONIC CO.,LTD.

8) After testing, the current Idd should be within initial value ±20%.

9) No low temperature bubbles ,end seal loose and fall, frame rainbow, ACF bubble

growing are allowable in the appearance test.

11.Inspection Criterion

11.1. Sampling Method

Unless otherwise agreed upon in writing, the sampling inspection shall be applied to the

Customer’s incoming inspection.

1) Lot size: Quantity per shipment lot

2) Sampling type: Normal inspection , single sampling

3) Inspection level: Ⅱ

4) Sampling table: MIL-STD-105D

5) Acceptable Quality Level(AQL): Major=0.65 Minor=1.5

11.2. Inspection Method

1) Ambient Condition:

a. Temperature: Room temperature 25±5℃

b. Illumination: Single fluorescent lamp non-directive(300 to 700 Lux)

2) Viewing distance

The distance between the LCD and the inspector’s eyes shall be at least 30-50cm.

3) Viewing Angle

The inspection shall be conducted within normal viewing angle range.

11.3. Inspection Criteria

11.3.1. Major defect

No.

Item

Inspection Standard

Classification

of defects

1

All

functional

defects

1) No display

2) Display abnormally

3) Open or missing segment

4) Short circuit

5) Excess power consumption

6) Backlight no lighting, flickering and abnormal lighting

Major

2

Missing

Missing component

Major

3

Outline

dimension

Overall outline dimension beyond the drawing is not

allowed

Major

11.3.2. Cosmetic Defect