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TBAV99 Datasheet(PDF) 1 Page - Toshiba Semiconductor |
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TBAV99 Datasheet(HTML) 1 Page - Toshiba Semiconductor |
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1 / 5 page ![]() TBAV99 1 Switching Diodes Silicon Epitaxial Planar TBAV99 TBAV99 TBAV99 TBAV99 Start of commercial production 2014-12 1. 1. 1. 1. Applications Applications Applications Applications • Ultra-High-Speed Switching 2. 2. 2. 2. Packaging and Internal Circuit Packaging and Internal Circuit Packaging and Internal Circuit Packaging and Internal Circuit SOT23 1: Anode 1 2: Cathode 2 3: Cathode1 / Anode 2 3. 3. 3. 3. Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Peak reverse voltage Reverse voltage Peak forward current Average rectified current Power dissipation Power dissipation Non-repetitive peak forward surge current Junction temperature Storage temperature Symbol VRM VR IFM IO PD PD IFSM Tj Tstg Note (Note 1) (Note 1) (Note 2) (Note 1), (Note 3) Rating 85 80 300 100 150 320 2 125 -55 to 125 Unit V mA mW mW A Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Unit rating. Total rating = Unit rating × 70 % Note 2: Device mounted on a 25.4 mm × 25.4 mm × 1.6 mm FR-4 glass epoxy board (Cu pad: 0.42 mm2 × 3) Note 3: Measured with a 10 ms pulse. 2015-11-26 Rev.2.0 ©2015 Toshiba Corporation |
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