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SN54HC00-DIE

SCLS747 – FEBRUARY 2014

SN54HC00-DIE Quadruple 2-Input Positive-NAND Gate

1

1 Features

•

Wide Operating Voltage Range

•

Low Power Consumption

•

Low Input Current

2 Description

The SN54HC00-DIE device contains four independent 2-input NAND gates. Each gate performs the Boolean

function of Y = A • B or Y = A + B in positive logic.

PACKAGE

PRODUCT

PACKAGE

ORDERABLE PART NUMBER

PACKAGE QUANTITY

DESIGNATOR

SN54HC00TDF1

400

SN54HC00

TD

SN54HC00TDF2

10

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality

Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room

temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not

warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.

1

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.