23LC512T-ESLASHP datasheet(3/32 Pages) MICROCHIP

3 / 32 page

 2012-2013 Microchip Technology Inc.

DS20005155B-page 3

23A512/23LC512

TABLE 1-3:

AC TEST CONDITIONS

TABLE 1-2:

AC CHARACTERISTICS

Industrial (I):

TA = -40°C to +85°C

Automotive (E): TA = -40°C to +125°C

Param.

No.

Sym.

Characteristic

Min.

Max.

Units

Test Conditions

1FCLK

Clock frequency

—

MHz

I-Temp

E-Temp

2TCSS

CS setup time

—ns

I-Temp

E-Temp

3TCSH

CS hold time

—

4TCSD

CS disable time

—ns

I-Temp

E-Temp

Tsu

Data setup time

—

6THD

Data hold time

—

7TR

CLK rise time

—

(Note 1)

8TF

CLK fall time

—

(Note 1)

9THI

Clock high time

—ns

I-Temp

E-Temp

TLO

Clock low time

—ns

I-Temp

E-Temp

TCLD

Clock delay time

—ns

I-Temp

E-Temp

Output valid from clock low

—25

I-Temp

E-Temp

THO

Output hold time

—

(Note 1)

TDIS

Output disable time

—20

—

THS

HOLD setup time

—

THH

HOLD hold time

—

THZ

HOLD low to output High-Z

—

THV

HOLD high to output valid

—

Note 1:

This parameter is periodically sampled and not 100% tested.

AC Waveform:

Input pulse level

0.1 VCC to 0.9 VCC

Input rise/fall time

5 ns

CL = 30 pF

—

Timing Measurement Reference Level:

Input

0.5 VCC

Output

0.5 VCC

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